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Tom Turner's presentation will be on Probabilistic Transfer Matrices in Symbolic Reliability Analysis of Logic Circuits. Citation: Probabilistic Transfer Matrices in Symbolic Reliability Analysis of Logic Circuits, S. Krishnaswamy; G. F. Viamontes; I. L. Markov & J. P. Hayes ACM Transactions on Design Automation of Electronic Systems, Vol. 13 No.1 Article 8 Pub. Date January 2008